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我們的服務(wù) 失效分析 功率器件參數(shù)測(cè)試
功率器件參數(shù)測(cè)試
廣電計(jì)量積極布局第三代半導(dǎo)體功率器件的測(cè)試業(yè)務(wù),引進(jìn)國(guó)際先進(jìn)的測(cè)試技術(shù),為功率半導(dǎo)體產(chǎn)業(yè)上下游企業(yè)提供器件參數(shù)檢測(cè)服務(wù),助力器件國(guó)產(chǎn)化、高新化發(fā)展。測(cè)試項(xiàng)目包括:靜態(tài)參數(shù)、動(dòng)態(tài)參數(shù)、熱特性、雪崩耐量、短路特性及絕緣耐壓測(cè)試;設(shè)備支持0-1500A,0-3000V的器件參數(shù)檢測(cè),覆蓋MIL-STD-750,IEC 60747系列,GB/T29332等標(biāo)準(zhǔn)。
服務(wù)介紹
隨著技術(shù)發(fā)展,第三代半導(dǎo)體功率器件開(kāi)始由實(shí)驗(yàn)室階段步入商業(yè)應(yīng)用,未來(lái)應(yīng)用潛力巨大,這些新型器件測(cè)試要求更高的電壓和功率水平,更快的開(kāi)關(guān)時(shí)間。
 

測(cè)試周期:

根據(jù)標(biāo)準(zhǔn)、試驗(yàn)條件及被測(cè)樣品量確定
 

產(chǎn)品范圍:

MOSFET、IGBT、DIODE、BJT,第三代半導(dǎo)體器件等分立器件,以及上述元件構(gòu)成的功率模塊
 

測(cè)試項(xiàng)目:

靜態(tài)參數(shù) 符號(hào)
Drain to Source Breakdown Voltage BVDSS
Drain Leakage Current IDSS
Gate Leakage Current IGSS
Gate Threshold Voltage VGS(th)
Drain to Source On Resistance RDS(on)
Drain to Source On Voltage VDS(on)
Body Diode Forward Voltage VSD
Internal Gate Resistance Rg
Input capacitance Cies
Output capacitance Coes
Reverse transfer capacitance Cres
Transconductance gfs
Gate to Source Plateau Voltage Vgs(pl)
動(dòng)態(tài)參數(shù) 符號(hào)
Turn-on delay time td(on)
Rise time tr
Turn-off delay time td(off)
Fall time tf
Turn-on energy Eon
Turn-off energy Eoff
Diode reverse recovery time trr
Diode reverse recovery charge Qrr
Diode peak reverse recovery current Irrm
Diode peak rate of fall of reverse
recovery current
dirr/dt
Total gate charge QG
Gate-Emitter charge QGC
Gate-Collector charge QGE
其他參數(shù) 符號(hào)
thermal resistance Rth
Unclamped Inductive Switching UIS
Reverse biased safe operating area RBSOA
Short circuit safe operation area SCSOA